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Maker Model Item Vintage
HITACHI S-9200 CD- SEM 2000
HITACHI S-9220 CD- SEM 2000
KLA TENCOR AIT-XUV Wafer INSPECTION SYSTEM 2003
KLA TENCOR AIT-II W/F INSPECTION
KLA TENCOR AIT W/F INSPECTION
KLA TENCOR KLA-2138 W/F INSPECTION 1996
KLA TENCOR EAGLE II W/F INSPECTION
KLA TENCOR SFS-6220 PARTICLE COUNTER 1996
ACCRETECH WW50 1400 PATTENRNED WAFER INSPECTION
SYSTEM(HIGH) 2002
ACCRETECH WinWin50-1500S PATTENRNED WAFER INSPECTION 2002
KLA TENCOR FT-750 FILM THICKNESS MEASUREMENT 1996
FAB SOLUTIONS EBS3000 E-BEAM INSP. 2003
HITACHI S-5000 SEM 1996
MIRERO WaBISH200T WABIS 2007
NANOMETRICS M8000XSE FILM THICKNESS MEASUREMENT
NANOMETRICS ATLAS FILM THICKNESS MEASUREMENT 2006
KLA TENCOR UV-1050 FILM THICKNESS MEASUREMENT
THERMA WAVE OP-2600 FILM THICKNESS MEASUREMENT
NANO METRA-7000 OVERLAY -
NANO METRA-7200 OVERAY
ACCENT Caliper Elan Ultra OVERLAY -
RIGAKU SYS3630 WD-XRF 1993
KLA TENCOR P-20H ALPHA-STEP
RUDOLPH MP-200 FILM THICKNESS MEASUREMENT SYSTEM
LEICA INS2000 REVIEW STATION
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